Scientific journal

ISSN 1814-2400

INFORMATION SCIENCE AND CONTROL SYSTEMS

Almina N.A., Gavrilov V.Y., Nomokonova N.N.

Microelectronic devices quality inspection with the marginal supply voltages method

The information and measuring system for the inspection of the microelectronic devices individual properties is proposed. This system is based on the marginal supply voltages method.

Keywords: marginal voltages, signature analyzer, LSI quality inspection, frequency response.